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NX-12 Atomic Force Microscope
A versatile microscopy platform for analytical chemistry researchers and shared user facilities.
WhatsappOverview
- Atomic Force Microscopy (AFM) for nanometer resolution imaging with electrical, magnetic, thermal, and mechanical property measurement capabilities
- Pipette-based scanning system for high resolution Scanning Ion Conductance Microscopy (SICM), Scanning Electrochemical Microscopy (SECM), and Scanning Electrochemical Cell Microscopy (SECCM)
- Inverted Optical Microscopy (IOM) for transparent material research and fluorescence microscopy integration
- Easy optical access with motorized focus stage
- Park SmartScan™ makes scanning fast and simple
