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NX-20 Atomic Force Microscope
The leading nano metrology tool for failure analysis and large sample research.
WhatsappOverview
- Sidewall measurements for 3D structure study
- Surface roughness measurements for media and substrates
- High resolution electrical scan mode
- Accurate and Reproducible Measurements for Better Productivity
- Reproduce Best AFM Measurement
- True Sample Topography™ without piezo creep error
