Atomic Force Microscope

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Park NX7 Atomic Force Microscope

The most affordable research grade AFM with flexible sample handling Park NX7 has all the state-of-the-art technology you have come to expect from Park Systems, at a price your lab can afford. Designed with the same attention to detail as our more advanced models, NX7 allows you to do your research on time and within budget.

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Overview

Accurate XY Scan by Crosstalk Elimination

  • Two independent, closed-loop XY and Z flexure scanners
  • Flat and orthogonal XY scan with low residual bow
  • Accurate height measurements without any need for software processing

The Most Extensible AFM Solution

  • The most comprehensive range of SPM modes
  • Advanced nanomechanical measurement modes are supported as default enabled by NX electronic controller
  • The best option compatibility and upgradeability in the industry

 User Experience-Driven Software and Hardware Features

  • Open side access for easy sample or tip exchange
  • Easy, intuitive laser alignment with pre-aligned tip mount
  • Park SmartScanTM - AFM operating software versatile enough to empower both novices and power users alike toward great nanoscale research