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Material Science & Nanotechnology
Surface Profiler
High Speed Profilometer HS2000
The HS2000 provides automated optical inspection at high speeds (up to 1m/s & data acquisition up to 31KHz) for quality control applications where speed and large areas or multiple measurements is critical.
Brand: Nanovea
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Warranty Details
The HS2000 with its granite base and air bearing stages provides superior stability at high speeds for flatness measurement. Comes with an enclosure and workstation to create a fully contained stand-alone instrument. The HS2000 equipped with a line sensor can inspect at speed of up to 200 times faster. Designed for stable high speed flatness measurement, advanced automation and customizable options.
• High Speed • Precision Flatness Measurement • Advanced Automation • User Friendly Technology • Rigid and Stable Structure • Customizable Options
For more information, do visit https://nanovea.com/instruments/hs2000/
Specification :
| Type | Stand Alone |
| X-Y Axis Travel | 400 x 500mm |
| Z Axis | 100mm Motorized |
| Maximum X-Y Speed | 500m/s |
| Stand Alone Dimensions | 101 x 106 x 195cm |
| Rotational Options | Software |
| Video Zoom Imaging | Available |
| Max Sample Weight | 7Kg |
| High Speed Line Sensor | Available |
| Technique | Non Contact Chromatic Confocal |
| Type of Light | White Light |
