All Products of Material Characterisation

High Speed Profilometer HS2000

High Speed Profilometer HS2000

The HS2000 provides automated optical inspection at high speeds (up to 1m/s & data acquisition up to 31KHz) for quality control applications where speed and large areas or multiple measurements is critical.
Large Area Profilometer ST500

Large Area Profilometer ST500

The ST500 provides fast large area measurement (without stitching) using a 400 mm X-Y axis travel with a maximum speed up to 200 mm/s
Profilometer ST400

Profilometer ST400

The ST400 is ideal for a wide range of samples with varied geometries.
Compact Profilometer PS50

Compact Profilometer PS50

The PS50 is the most advanced compact Profilometer available
Portable Profilometer Jr25

Portable Profilometer Jr25

The Jr25 is the first truly portable high performance Profilometer of its kind. With an optional battery pack and carrying case, the Jr25 provides measurement capability during field studies.
Cathodoluminescence for STEM Mönch 4107

Cathodoluminescence for STEM Mönch 4107

High throughput and high efficiency Cathodoluminescence for STEM
Cathodoluminescence Spectroscopy Rosa 4634

Cathodoluminescence Spectroscopy Rosa 4634

Quantitative Cathodoluminescence Dedicated to Photovoltaic and Silicon Applications
Non-contact Sheet Resistance Sensor EddyCus TF Inline

Non-contact Sheet Resistance Sensor EddyCus TF Inline

Non-contact sheet resistance and layer thickness measurement solutions for process control
Non-contact Sheet Resistance Mapping EddyCus TF Map 2525

Non-contact Sheet Resistance Mapping EddyCus TF Map 2525

The Eddy­Cus TF map 2525SR auto­mat­ic­ally meas­ures the sheet res­ist­ance of large samples up to 250 x 250 mm² (10 x 10 inches) in non-con­tact mode
Non-Contact Thin Film Measurement EddyCus TF Lab 2020

Non-Contact Thin Film Measurement EddyCus TF Lab 2020

Non-contact sheet resistance and layer thickness measurement device for single point measurements
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