SingaporeSG
ChinaCN
MalaysiaMY
IndonesiaID
MyanmarMM
Material Science & Nanotechnology
All Products of Material Characterisation
Park NX7 Atomic Force Microscope
The most affordable research grade AFM with flexible sample handling
Park NX7 has all the state-of-the-art technology you have come to expect from Park Systems, at a price your lab can afford. Designed with the same attention to d...
SK-FTM Compact Thickness Film Monitor
Compact film thickness monitor is a small and highly accurate reflective spectroscopic film thickness meter that uses a reflective probe with excellent optical properties.
It also can be used as an in-line monitoe during the pro...
SK-FTM-MAP Wafer Mapping Film Thickness
Automatic mapping film thickness measurement over the entire surface of wafers up to 300 mm.
Atomic Force Microscope FX40
Get the highest resolution images and most accurate data autonomously, thereby accelerating your research. Unlike others, Park FX40 takes care of everything automatically: from tip pick up to landing to full autonomous scanning of...
Atomic Force Microscope NX-10
Park NX10 produces data you can trust, replicate, and publish at the highest nano resolution. From sample setting to full scan imaging, measurement, and analysis, Park NX10 saves you time every step of the way. With more time and ...
Atomic Force Microscope NX-Hivac
High vacuum atomic force microscope for failure analysis and atmosphere-sensitive materials research
Atomic Force Microscope NX-Bio
The most powerful nanoscale microscopy for life science.
Atomic Force Microscope NX-12
A versatile microscopy platform for analytical chemistry researchers and shared user facilities.
Atomic Force Microscope NX-20
The leading nano metrology tool for failure analysis and large sample research.
Handheld Sheet Resistance Tester EddyCus TF Portable 1010
Handheld device for sheet resistance measurement
Non-Contact Thin Film Measurement EddyCus TF Lab 2020
Non-contact sheet resistance and layer thickness measurement device for single point measurements
Non-contact Sheet Resistance Mapping EddyCus TF Map 2525
The EddyCus TF map 2525SR automatically measures the sheet resistance of large samples up to 250 x 250 mm² (10 x 10 inches) in non-contact mode
Non-contact Sheet Resistance Sensor EddyCus TF Inline
Non-contact sheet resistance and layer thickness measurement solutions for process control
Cathodoluminescence Spectroscopy Grammont 2172
The First Comprehensive Quantitative Cathodoluminescence Solution
Cathodoluminescence Spectroscopy Allalin 4027
Blazing Fast Multi-Channel Cathodoluminescence at Low Temperature
Page 1 of 2 (24 products)
