All Products of Material Characterisation

Atomic Force Microscope NX-10

Atomic Force Microscope NX-10

Park NX10 produces data you can trust, replicate, and publish at the highest nano resolution. From sample setting to full scan imaging, measurement, and analysis, Park NX10 saves you time every step of the way. With more time and ...
Atomic Force Microscope XE-7

Atomic Force Microscope XE-7

Park XE7 has all the state-of-the-art technology you've come to expect from Park Systems, at a price your lab can afford. Designed with the same attention to detail as our more advanced models, the XE7 allows you to do your resear...
Atomic Force Microscope NX-Hivac

Atomic Force Microscope NX-Hivac

High vacuum atomic force microscope for failure analysis and atmosphere-sensitive materials research
Atomic Force Microscope NX-12

Atomic Force Microscope NX-12

A versatile microscopy platform for analytical chemistry researchers and shared user facilities.
Atomic Force Microscope NX-20

Atomic Force Microscope NX-20

The leading nano metrology tool for failure analysis and large sample research.
Thin Film Thickness Measurement MProbe20

Thin Film Thickness Measurement MProbe20

The MProbe 20 series is a desktop system for thin-film thickness measurement. The measurement is based on spectroscopic reflectance and uses fiber optics retro-reflecting probe. This approach yields a compact, easy to use and affo...
Non-Contact Thin Film Measurement EddyCus TF Lab 2020

Non-Contact Thin Film Measurement EddyCus TF Lab 2020

Non-contact sheet resistance and layer thickness measurement device for single point measurements
Non-contact Sheet Resistance Mapping EddyCus TF Map 2525

Non-contact Sheet Resistance Mapping EddyCus TF Map 2525

The Eddy­Cus TF map 2525SR auto­mat­ic­ally meas­ures the sheet res­ist­ance of large samples up to 250 x 250 mm² (10 x 10 inches) in non-con­tact mode
Non-contact Sheet Resistance Sensor EddyCus TF Inline

Non-contact Sheet Resistance Sensor EddyCus TF Inline

Non-contact sheet resistance and layer thickness measurement solutions for process control
Cathodoluminescence Spectroscopy Rosa 4634

Cathodoluminescence Spectroscopy Rosa 4634

Quantitative Cathodoluminescence Dedicated to Photovoltaic and Silicon Applications
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