All Products of Material Characterisation

SK-FTM Compact Thickness Film Monitor

SK-FTM Compact Thickness Film Monitor

Compact film thickness monitor is a small and highly accurate reflective spectroscopic film thickness meter that uses a reflective probe with excellent optical properties. It also can be used as an in-line monitoe during the pro...
SK-FTM-MAP Wafer Mapping Film Thickness

SK-FTM-MAP Wafer Mapping Film Thickness

Automatic mapping film thickness measurement over the entire surface of wafers up to 300 mm.
Atomic Force Microscope FX40

Atomic Force Microscope FX40

Get the highest resolution images and most accurate data autonomously, thereby accelerating your research. Unlike others, Park FX40 takes care of everything automatically: from tip pick up to landing to full autonomous scanning of...
Atomic Force Microscope NX-10

Atomic Force Microscope NX-10

Park NX10 produces data you can trust, replicate, and publish at the highest nano resolution. From sample setting to full scan imaging, measurement, and analysis, Park NX10 saves you time every step of the way. With more time and ...
Atomic Force Microscope XE-7

Atomic Force Microscope XE-7

Park XE7 has all the state-of-the-art technology you've come to expect from Park Systems, at a price your lab can afford. Designed with the same attention to detail as our more advanced models, the XE7 allows you to do your resear...
Atomic Force Microscope NX-Hivac

Atomic Force Microscope NX-Hivac

High vacuum atomic force microscope for failure analysis and atmosphere-sensitive materials research
Atomic Force Microscope NX-12

Atomic Force Microscope NX-12

A versatile microscopy platform for analytical chemistry researchers and shared user facilities.
Atomic Force Microscope NX-20

Atomic Force Microscope NX-20

The leading nano metrology tool for failure analysis and large sample research.
Non-Contact Thin Film Measurement EddyCus TF Lab 2020

Non-Contact Thin Film Measurement EddyCus TF Lab 2020

Non-contact sheet resistance and layer thickness measurement device for single point measurements
Non-contact Sheet Resistance Mapping EddyCus TF Map 2525

Non-contact Sheet Resistance Mapping EddyCus TF Map 2525

The Eddy­Cus TF map 2525SR auto­mat­ic­ally meas­ures the sheet res­ist­ance of large samples up to 250 x 250 mm² (10 x 10 inches) in non-con­tact mode
Non-contact Sheet Resistance Sensor EddyCus TF Inline

Non-contact Sheet Resistance Sensor EddyCus TF Inline

Non-contact sheet resistance and layer thickness measurement solutions for process control
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