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Material Science & Nanotechnology
All Products of Material Characterisation
Park NX7 Atomic Force Microscope
The most affordable research grade AFM with flexible sample handling
Park NX7 has all the state-of-the-art technology you have come to expect from Park Systems, at a price your lab can afford. Designed with the same attention to d...
Accurion EP4 Imaging Ellipsometer
The EP4, our latest generation of imaging ellipsometers, combines ellipsometry and microscopy. This enables the characterization of thickness and refractive index with the sensitivity of ellipsometry on micro-structures as small a...
Accurion i4 Series Active Vibration Isolation System
The i4 is a state-of-the-art active vibration isolation system. It is ideal for isolating high-resolution measurement equipment from building vibrations and other disturbances, while providing active compensation in all six degree...
Park SmartAnalysis™ The Park AFM Image Analytics Software
Park SmartAnalysis™ is an atomic force microscopy image processing
and data analysis software for Park AFM.
Park NX-IR R300 The Nanoscale Infrared Spectro-Microscopy System
Park NX-IR R300 is a nanoscale infrared spectroscopy system for up to 300 mm semiconductor wafers.
Park NX-Mask An AFM-based EUV Mask Repair and More
Park NX-Mask is the new generation photomask repair system that addresses the latest challenges of shrinking device geometries and increasing photomask complexities.
SK-FTM Compact Thickness Film Monitor
Compact film thickness monitor is a small and highly accurate reflective spectroscopic film thickness meter that uses a reflective probe with excellent optical properties.
It also can be used as an in-line monitoe during the pro...
SK-FTM-MAP Wafer Mapping Film Thickness
Automatic mapping film thickness measurement over the entire surface of wafers up to 300 mm.
FX40 Atomic Force Microscope
Get the highest resolution images and most accurate data autonomously, thereby accelerating your research. Unlike others, Park FX40 takes care of everything automatically: from tip pick up to landing to full autonomous scanning of...
NX-10 Atomic Force Microscope
Park NX10 produces data you can trust, replicate, and publish at the highest nano resolution. From sample setting to full scan imaging, measurement, and analysis, Park NX10 saves you time every step of the way. With more time and ...
NX-Hivac Atomic Force Microscope
High vacuum atomic force microscope for failure analysis and atmosphere-sensitive materials research
NX-Bio Atomic Force Microscope
The most powerful nanoscale microscopy for life science.
NX-12 Atomic Force Microscope
A versatile microscopy platform for analytical chemistry researchers and shared user facilities.
NX-20 Atomic Force Microscope
The leading nano metrology tool for failure analysis and large sample research.
Handheld Sheet Resistance Tester EddyCus TF Portable 1010
Handheld device for sheet resistance measurement
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