The most affordable research grade AFM with flexible sample handling
Park NX7 has all the state-of-the-art technology you have come to expect from Park Systems, at a price your lab can afford. Designed with the same attention to d...
The EP4, our latest generation of imaging ellipsometers, combines ellipsometry and microscopy. This enables the characterization of thickness and refractive index with the sensitivity of ellipsometry on micro-structures as small a...
The i4 is a state-of-the-art active vibration isolation system. It is ideal for isolating high-resolution measurement equipment from building vibrations and other disturbances, while providing active compensation in all six degree...
Park NX-Mask is the new generation photomask repair system that addresses the latest challenges of shrinking device geometries and increasing photomask complexities.
Compact film thickness monitor is a small and highly accurate reflective spectroscopic film thickness meter that uses a reflective probe with excellent optical properties.
It also can be used as an in-line monitoe during the pro...
Get the highest resolution images and most accurate data autonomously, thereby accelerating your research. Unlike others, Park FX40 takes care of everything automatically: from tip pick up to landing to full autonomous scanning of...
Park NX10 produces data you can trust, replicate, and publish at the highest nano resolution. From sample setting to full scan imaging, measurement, and analysis, Park NX10 saves you time every step of the way. With more time and ...