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Material Characterisation
Atomic Force Microscope
Park NX7 Atomic Force Microscope
The most affordable research grade AFM with flexible sample handling
Park NX7 has all the state-of-the-art technology you have come to expect from Park Systems, at a price your lab can afford. Designed with the same attention to d...
Park SmartAnalysis™ The Park AFM Image Analytics Software
Park SmartAnalysis™ is an atomic force microscopy image processing
and data analysis software for Park AFM.
Park NX-IR R300 The Nanoscale Infrared Spectro-Microscopy System
Park NX-IR R300 is a nanoscale infrared spectroscopy system for up to 300 mm semiconductor wafers.
Park NX-Mask An AFM-based EUV Mask Repair and More
Park NX-Mask is the new generation photomask repair system that addresses the latest challenges of shrinking device geometries and increasing photomask complexities.
FX40 Atomic Force Microscope
Get the highest resolution images and most accurate data autonomously, thereby accelerating your research. Unlike others, Park FX40 takes care of everything automatically: from tip pick up to landing to full autonomous scanning of...
NX-10 Atomic Force Microscope
Park NX10 produces data you can trust, replicate, and publish at the highest nano resolution. From sample setting to full scan imaging, measurement, and analysis, Park NX10 saves you time every step of the way. With more time and ...
NX-Hivac Atomic Force Microscope
High vacuum atomic force microscope for failure analysis and atmosphere-sensitive materials research
NX-Bio Atomic Force Microscope
The most powerful nanoscale microscopy for life science.
NX-12 Atomic Force Microscope
A versatile microscopy platform for analytical chemistry researchers and shared user facilities.
NX-20 Atomic Force Microscope
The leading nano metrology tool for failure analysis and large sample research.
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