Thin Film Measurement

SK-FTM Compact Thickness Film Monitor

SK-FTM Compact Thickness Film Monitor

Compact film thickness monitor is a small and highly accurate reflective spectroscopic film thickness meter that uses a reflective probe with excellent optical properties. It also can be used as an in-line monitoe during the pro...
SK-FTM-MAP Wafer Mapping Film Thickness

SK-FTM-MAP Wafer Mapping Film Thickness

Automatic mapping film thickness measurement over the entire surface of wafers up to 300 mm.
Non-Contact Thin Film Measurement EddyCus TF Lab 2020

Non-Contact Thin Film Measurement EddyCus TF Lab 2020

Non-contact sheet resistance and layer thickness measurement device for single point measurements
Non-contact Sheet Resistance Mapping EddyCus TF Map 2525

Non-contact Sheet Resistance Mapping EddyCus TF Map 2525

The Eddy­Cus TF map 2525SR auto­mat­ic­ally meas­ures the sheet res­ist­ance of large samples up to 250 x 250 mm² (10 x 10 inches) in non-con­tact mode
Non-contact Sheet Resistance Sensor EddyCus TF Inline

Non-contact Sheet Resistance Sensor EddyCus TF Inline

Non-contact sheet resistance and layer thickness measurement solutions for process control
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