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Park Systems is the global leader in Atomic Force Microscopy (AFM), providing the world’s most accurate nanoscale metrology solutions. Founded by Dr. Sang-il Park, a co-inventor of the AFM, the company has revolutionized the industry by moving beyond conventional "monolithic" scanners to a Decoupled XY and Z architecture.
As the Authorized Distributor in Malaysia, Gaia Science brings this German and Korean-engineered precision to local researchers, offering full installation, IQ/OQ validation, and specialized technical support.
Get the highest resolution images and most accurate data autonomously, thereby accelerating your research. Unlike others, Park FX40 takes care of everything automatically: from tip pick up to landing to full autonomous scanning of the sample at a click of a button. It does this by infusing robotics, AI and machine learning into its groundbreaking FX system.
Park NX10 produces data you can trust, replicate, and publish at the highest nano resolution. From sample setting to full scan imaging, measurement, and analysis, Park NX10 saves you time every step of the way. With more time and better data, you can focus on doing more innovative research.
A versatile microscopy platform for analytical chemistry researchers and shared user facilities.
High vacuum atomic force microscope for failure analysis and atmosphere-sensitive materials research
The most affordable research grade AFM with flexible sample handling Park NX7 has all the state-of-the-art technology you have come to expect from Park Systems, at a price your lab can afford. Designed with the same attention to detail as our more advanced models, NX7 allows you to do your research on time and within budget.
Park NX-IR R300 is a nanoscale infrared spectroscopy system for up to 300 mm semiconductor wafers.
Park NX-Mask is the new generation photomask repair system that addresses the latest challenges of shrinking device geometries and increasing photomask complexities.
Park SmartAnalysis™ is an atomic force microscopy image processing and data analysis software for Park AFM.
The EP4, our latest generation of imaging ellipsometers, combines ellipsometry and microscopy. This enables the characterization of thickness and refractive index with the sensitivity of ellipsometry on micro-structures as small as 1 µm.
