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Material Science & Nanotechnology
Atomic Force Microscope
NX-10 Atomic Force Microscope
Park NX10 produces data you can trust, replicate, and publish at the highest nano resolution. From sample setting to full scan imaging, measurement, and analysis, Park NX10 saves you time every step of the way. With more time and better data, you can focus on doing more innovative research.
Brand: Park Systems
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Warranty Details
- Accurate XY Scan by Crosstalk Elimination
- Accurate AFM Topography with Low Noise Z Detector
- Best Tip Life, Resolution and Sample Preservation by True Non-Contact™ Mode
- User Experience-Driven Software and Hardware Features
- Single-Click Imaging with SmartScan™ Auto Mode
- The wide range of scanning modes and modular design of the NX series allows it to be easily tailored to the needs of any scanning probe microscopy project.
- The Most Comprehensive and Extensible AFM Solution
Specification :
| Z scanner | |
| Scan range | 5 µm (optional 30 µm) |
| Resolution | 0.015 nm |
| Position detector noise | 0.03 nm (bandwidth: 1 kHz) |
| Resonant frequency | > 9 kHz (typically 10.5 kHz) |
| XY scanner | |
| Scan range | 50 µm × 50 µm (optional 10 µm × 10 µm or 100 µm × 100 µm) |
| Resolution | 0.05 nm |
| Position detector noise | < 0.25 nm (bandwidth: 1 kHz) |
| Out-of-plane motion | < 2 nm (over 40 µm scan) |
| Stage | |
| Z stage range | 25 mm |
| Focus travel range | 15 mm |
| XY stage travel range | 20 mm x 20 mm |
| Sample size | Open space up to 100 mm x 100 mm, thickness up to 20 mm |
| Sample weight | < 500 g |
