Material Science & Nanotechnology

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Thin Film Measurement

SK-FTM Compact Thickness Film Monitor

Compact film thickness monitor is a small and highly accurate reflective spectroscopic film thickness meter that uses a reflective probe with excellent optical properties. It also can be used as an in-line monitoe during the process or as an end-point detection sensor.

Pricing & Availability

Compact probe with optical fiber.
Good repeatability of the film thickness measurement 0.1nm ( 3 α ).
Multilayer film thickness measurement up to 9 layers.
Material analysis function such as evaluation of mixing ratio of the composite, Crystallinity Analysis and Analysis of the optical constant.
Various selection of light source options.
Wireless option for remote control and monitor.
Film thickness end point detection software included.
Automatic mapping stage available as options.