SingaporeSG
ChinaCN
MalaysiaMY
IndonesiaID
MyanmarMM
Material Characterisation
Thin Film Measurement - Park Systems
Accurion EP4 Imaging Ellipsometer
The EP4, our latest generation of imaging ellipsometers, combines ellipsometry and microscopy. This enables the characterization of thickness and refractive index with the sensitivity of ellipsometry on micro-structures as small a...
Accurion i4 Series Active Vibration Isolation System
The i4 is a state-of-the-art active vibration isolation system. It is ideal for isolating high-resolution measurement equipment from building vibrations and other disturbances, while providing active compensation in all six degree...
Page 1 of 1 (2 products)
