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Material Characterisation
Thin Film Measurement - Shashin Kagaku
SK-FTM Compact Thickness Film Monitor
Compact film thickness monitor is a small and highly accurate reflective spectroscopic film thickness meter that uses a reflective probe with excellent optical properties.
It also can be used as an in-line monitoe during the pro...
SK-FTM-MAP Wafer Mapping Film Thickness
Automatic mapping film thickness measurement over the entire surface of wafers up to 300 mm.
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